X-ray diffraction microscopy special issue

In anticipation of the International Year of Crystallography in 2014, Journal of Applied Crystallography presents a virtual issue on recent developments in X-ray diffraction microscopy. This issue collects together a series of articles originally published in the journal between August 2012 and April 2013, which focus on novel diffraction methods that enable visualization of the internal structure of crystalline materials from the millimetre down to the nanometre scale.

Contact Peter Strickland
URL http://journals.iucr.org/special_issues/2013/imaging/
Category publications